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Bibliographic Details
Main Authors: Rondinelli, James M., Spaldin, Nicola A.
Format: Preprint
Published: 2011
Subjects:
Online Access:https://arxiv.org/abs/1103.4418
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_version_ 1866909641679568896
author Rondinelli, James M.
Spaldin, Nicola A.
author_facet Rondinelli, James M.
Spaldin, Nicola A.
contents The confluence of state-of-the-art electronic-structure computations and modern synthetic materials growth techniques is proving indispensable in the search for and discovery of new functionalities in oxide thin films and heterostructures. Here, we review the recent contributions of electronic-structure calculations to predicting, understanding, and discovering new materials physics in thin-film perovskite oxides. We show that such calculations can accurately predict both structure and properties in advance of film synthesis, thereby guiding the search for materials combinations with specific targeted functionalities. In addition, because they can isolate and decouple the effects of various parameters which unavoidably occur simultaneously in an experiment -- such as epitaxial strain, interfacial chemistry and defect profiles -- they are able to provide new fundamental knowledge about the underlying physics. We conclude by outlining the limitations of current computational techniques, as well as some important open questions that we hope will motivate further methodological developments in the field.
format Preprint
id arxiv_https___arxiv_org_abs_1103_4418
institution arXiv
publishDate 2011
record_format arxiv
spellingShingle Structure and properties of functional oxide thin films: Insights from electronic-structure calculations
Rondinelli, James M.
Spaldin, Nicola A.
Materials Science
The confluence of state-of-the-art electronic-structure computations and modern synthetic materials growth techniques is proving indispensable in the search for and discovery of new functionalities in oxide thin films and heterostructures. Here, we review the recent contributions of electronic-structure calculations to predicting, understanding, and discovering new materials physics in thin-film perovskite oxides. We show that such calculations can accurately predict both structure and properties in advance of film synthesis, thereby guiding the search for materials combinations with specific targeted functionalities. In addition, because they can isolate and decouple the effects of various parameters which unavoidably occur simultaneously in an experiment -- such as epitaxial strain, interfacial chemistry and defect profiles -- they are able to provide new fundamental knowledge about the underlying physics. We conclude by outlining the limitations of current computational techniques, as well as some important open questions that we hope will motivate further methodological developments in the field.
title Structure and properties of functional oxide thin films: Insights from electronic-structure calculations
topic Materials Science
url https://arxiv.org/abs/1103.4418