Tohutoro APA (7th ed.)

Marks, S. D., Quan, P., Liu, R., Highland, M. J., Zhou, H., Keuch, T. F., . . . Evans, P. G. (2020). Instrument for in situ hard x-ray nanobeam characterization during epitaxial crystallization and materials transformations.

Tohutoru Kātū Chicago (17th ed.)

Marks, Samuel D., Peiyu Quan, Rui Liu, Matthew J. Highland, Hua Zhou, Thomas F. Keuch, G. Brian Stephenson, me Paul G. Evans. Instrument for in Situ Hard X-ray Nanobeam Characterization During Epitaxial Crystallization and Materials Transformations. 2020.

Tohutoro MLA (9th ed.)

Marks, Samuel D., et al. Instrument for in Situ Hard X-ray Nanobeam Characterization During Epitaxial Crystallization and Materials Transformations. 2020.