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| Autors principals: | , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , |
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| Format: | Preprint |
| Publicat: |
2023
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| Matèries: | |
| Accés en línia: | https://arxiv.org/abs/2310.14706 |
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| author | Liguori, Antonio Barten, Rebecca Baruffaldi, Filippo Bergamaschi, Anna Borghi, Giacomo Boscardin, Maurizio Brückner, Martin Butcher, Tim Alexander Carulla, Maria Vignali, Matteo Centis Dinapoli, Roberto Ebner, Simon Ficorella, Francesco Fröjdh, Erik Greiffenberg, Dominic Ali, Omar Hammad Hasanaj, Shqipe Heymes, Julian Hinger, Viktoria King, Thomas Kozlowski, Pawel Lopez-Cuenca, Carlos Mezza, Davide Moustakas, Konstantinos Mozzanica, Aldo Paternoster, Giovanni Paton, Kirsty A. Ronchin, Sabina Ruder, Christian Schmitt, Bernd Thattil, Dhanya Xie, Xiangyu Zhang, Jiaguo . |
| author_facet | Liguori, Antonio Barten, Rebecca Baruffaldi, Filippo Bergamaschi, Anna Borghi, Giacomo Boscardin, Maurizio Brückner, Martin Butcher, Tim Alexander Carulla, Maria Vignali, Matteo Centis Dinapoli, Roberto Ebner, Simon Ficorella, Francesco Fröjdh, Erik Greiffenberg, Dominic Ali, Omar Hammad Hasanaj, Shqipe Heymes, Julian Hinger, Viktoria King, Thomas Kozlowski, Pawel Lopez-Cuenca, Carlos Mezza, Davide Moustakas, Konstantinos Mozzanica, Aldo Paternoster, Giovanni Paton, Kirsty A. Ronchin, Sabina Ruder, Christian Schmitt, Bernd Thattil, Dhanya Xie, Xiangyu Zhang, Jiaguo . |
| contents | Experiments at synchrotron radiation sources and X-ray Free-Electron Lasers in the soft X-ray energy range ($250$eV--$2$keV) stand to benefit from the adaptation of the hybrid silicon detector technology for low energy photons. Inverse Low Gain Avalanche Diode (iLGAD) sensors provide an internal gain, enhancing the signal-to-noise ratio and allowing single photon detection below $1$keV using hybrid detectors. In addition, an optimization of the entrance window of these sensors enhances their quantum efficiency (QE). In this work, the QE and the gain of a batch of different iLGAD diodes with optimized entrance windows were characterized using soft X-rays at the Surface/Interface:Microscopy beamline of the Swiss Light Source synchrotron. Above $250$eV, the QE is larger than $55\%$ for all sensor variations, while the charge collection efficiency is close to $100\%$. The average gain depends on the gain layer design of the iLGADs and increases with photon energy. A fitting procedure is introduced to extract the multiplication factor as a function of the absorption depth of X-ray photons inside the sensors. In particular, the multiplication factors for electron- and hole-triggered avalanches are estimated, corresponding to photon absorption beyond or before the gain layer, respectively. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2310_14706 |
| institution | arXiv |
| publishDate | 2023 |
| record_format | arxiv |
| spellingShingle | Characterization of iLGADs using soft X-rays Liguori, Antonio Barten, Rebecca Baruffaldi, Filippo Bergamaschi, Anna Borghi, Giacomo Boscardin, Maurizio Brückner, Martin Butcher, Tim Alexander Carulla, Maria Vignali, Matteo Centis Dinapoli, Roberto Ebner, Simon Ficorella, Francesco Fröjdh, Erik Greiffenberg, Dominic Ali, Omar Hammad Hasanaj, Shqipe Heymes, Julian Hinger, Viktoria King, Thomas Kozlowski, Pawel Lopez-Cuenca, Carlos Mezza, Davide Moustakas, Konstantinos Mozzanica, Aldo Paternoster, Giovanni Paton, Kirsty A. Ronchin, Sabina Ruder, Christian Schmitt, Bernd Thattil, Dhanya Xie, Xiangyu Zhang, Jiaguo . Instrumentation and Detectors Experiments at synchrotron radiation sources and X-ray Free-Electron Lasers in the soft X-ray energy range ($250$eV--$2$keV) stand to benefit from the adaptation of the hybrid silicon detector technology for low energy photons. Inverse Low Gain Avalanche Diode (iLGAD) sensors provide an internal gain, enhancing the signal-to-noise ratio and allowing single photon detection below $1$keV using hybrid detectors. In addition, an optimization of the entrance window of these sensors enhances their quantum efficiency (QE). In this work, the QE and the gain of a batch of different iLGAD diodes with optimized entrance windows were characterized using soft X-rays at the Surface/Interface:Microscopy beamline of the Swiss Light Source synchrotron. Above $250$eV, the QE is larger than $55\%$ for all sensor variations, while the charge collection efficiency is close to $100\%$. The average gain depends on the gain layer design of the iLGADs and increases with photon energy. A fitting procedure is introduced to extract the multiplication factor as a function of the absorption depth of X-ray photons inside the sensors. In particular, the multiplication factors for electron- and hole-triggered avalanches are estimated, corresponding to photon absorption beyond or before the gain layer, respectively. |
| title | Characterization of iLGADs using soft X-rays |
| topic | Instrumentation and Detectors |
| url | https://arxiv.org/abs/2310.14706 |