Nishimura, R., Kishimoto, S., Sasaki, T., Mitsui, S., Shinya, M., Arai, Y., & Miyoshi, T. (2024). Fine residual stress distribution measurement of steel materials by SOI pixel detector with synchrotron X-rays.
Chicago Style (17th ed.) CitationNishimura, Ryutaro, Shunji Kishimoto, Toshihiko Sasaki, Shingo Mitsui, Masayoshi Shinya, Yasuo Arai, and Toshinobu Miyoshi. Fine Residual Stress Distribution Measurement of Steel Materials by SOI Pixel Detector with Synchrotron X-rays. 2024.
MLA citiranjeNishimura, Ryutaro, et al. Fine Residual Stress Distribution Measurement of Steel Materials by SOI Pixel Detector with Synchrotron X-rays. 2024.
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