Lignende værker

• Chemical and Electronic Structure of Buried W/Cu, W/Cr, and W/Mo Interfaces by In Situ XPS/HAXPES Auger Parameter Analysis
  af: Claudia Cancellieri, et al.
  Udgivet: (2025)
• Refining interface stress measurement in nanomultilayers through layer corrugation and interface roughness corrections
  af: Hu, Yang, et al.
  Udgivet: (2025)
• Uncovering the origin of interface stress enhancement and compressive-to-tensile stress transition in immiscible nanomultilayers
  af: Hu, Yang, et al.
  Udgivet: (2024)
• Hydroxylation-driven surface reconstruction at the origin of compressive-to-tensile stress transition in metal oxide nanoparticles
  af: Hu, Yang, et al.
  Udgivet: (2025)
• Auger parameter analysis for TiN and AlN thin films via combined in-situ XPS and HAXPES
  af: Pshyk, O. V., et al.
  Udgivet: (2025)