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| Main Authors: | , , , , |
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| Format: | Preprint |
| Published: |
2024
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| Subjects: | |
| Online Access: | https://arxiv.org/abs/2412.04421 |
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Table of Contents:
- We report the achievement of single-qubit gates with sub-part-per-million error rates, in a trapped-ion $^{43}$Ca$^{+}$ hyperfine clock qubit. We explore the speed/fidelity trade-off for gate times $4.4\leq t_{g}\leq35~μ$s, and benchmark a minimum error per Clifford gate of $1.5(4) \times 10^{-7}$. Calibration errors are suppressed to $< 10^{-8}$, leaving qubit decoherence ($T_{2}\approx 70$ s), leakage, and measurement as the dominant error contributions. The ion is held above a microfabricated surface-electrode trap which incorporates a chip-integrated microwave resonator for electronic qubit control; the trap is operated at room temperature without magnetic shielding.