Van Osch, B., Paurevic, A., Sakr, A., Joshi, T., van der Bovenkamp, D., Nicolau, Q. T., . . . Baugh, J. (2025). Automated tuning and characterization of single-electron and single-hole transistor charge sensors.
Chicago Style (17th ed.) CitationVan Osch, Benjamin, Andrija Paurevic, Ali Sakr, Tanmay Joshi, Dennis van der Bovenkamp, Quim T. Nicolau, Floris A. Zwanenburg, and Jonathan Baugh. Automated Tuning and Characterization of Single-electron and Single-hole Transistor Charge Sensors. 2025.
MLA (9th ed.) CitationVan Osch, Benjamin, et al. Automated Tuning and Characterization of Single-electron and Single-hole Transistor Charge Sensors. 2025.
Warning: These citations may not always be 100% accurate.