類似資料

• A Comprehensive Survey for Real-World Industrial Defect Detection: Challenges, Approaches, and Prospects
  著者:: Cheng, Yuqi, 等
  出版事項: (2025)
• Advancements in Point Cloud-Based 3D Defect Detection and Classification for Industrial Systems: A Comprehensive Survey
  著者:: Rani, Anju, 等
  出版事項: (2024)
• A Survey on RGB, 3D, and Multimodal Approaches for Unsupervised Industrial Image Anomaly Detection
  著者:: Lin, Yuxuan, 等
  出版事項: (2024)
• Exploring Few-Shot Defect Segmentation in General Industrial Scenarios with Metric Learning and Vision Foundation Models
  著者:: Liu, Tongkun, 等
  出版事項: (2025)
• Deep Industrial Image Anomaly Detection: A Survey
  著者:: Liu, Jiaqi, 等
  出版事項: (2023)