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| Main Authors: | , , , , , , , , , , |
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| Format: | Preprint |
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2025
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| Online Access: | https://arxiv.org/abs/2504.16388 |
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| _version_ | 1866915253955067904 |
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| author | Enokidani, Umi Matsuhara, Hideo Nakagawa, Takao Baba, Shunsuke Hirahara, Yasuhiro Koga, Ryoichi LI, Yuan Zhao, Biao Takama, Daiki Sasago, Hiroshi Wada, Takehiko |
| author_facet | Enokidani, Umi Matsuhara, Hideo Nakagawa, Takao Baba, Shunsuke Hirahara, Yasuhiro Koga, Ryoichi LI, Yuan Zhao, Biao Takama, Daiki Sasago, Hiroshi Wada, Takehiko |
| contents | We have been developing a CdZnTe immersion grating for a compact high-dispersion mid-infrared spectrometer (wavelength range 10--18 $μ$m, spectral resolution $R = λ/Δλ> 25,000$, operating temperature $T < 20$ K). Using an immersion grating, the spectrometer size can be reduced to $1/n$ ($n$: refractive index) compared to conventional diffraction gratings. CdZnTe is promising as a material for immersion gratings for the wavelength range. However, the refractive index $n$ of CdZnTe has not been measured at $T < 20$ K.
We have been developing a system to precisely measure $n$ at cryogenic temperatures ($T \sim 10$ K) in the mid-infrared wavelength range. As the first result, this paper reports the temperature dependence of $n$ of CdZnTe at the wavelength of 10.68 $μ$m. This system employs the minimum deviation method. The refractive index $n$ of CdZnTe is measured at temperatures of \( T = 12.57, 22.47, 50.59, 70.57, \text{ and } 298 \, \text{K} \). We find that $n$ of CdZnTe at $λ=$ 10.68 $μ$m is $2.6371 \pm 0.0022$ at $12.57 \pm 0.14$ K, and the average temperature dependence of $n$ between 12.57 $\pm$ 0.14 K and 70.57 $\pm$ 0.23 K is $Δn/ΔT = (5.8 \pm 0.3) \times 10^{-5}$ K$^{-1}$. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2504_16388 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Measurement of the Temperature Dependence of the Refractive Index of CdZnTe Enokidani, Umi Matsuhara, Hideo Nakagawa, Takao Baba, Shunsuke Hirahara, Yasuhiro Koga, Ryoichi LI, Yuan Zhao, Biao Takama, Daiki Sasago, Hiroshi Wada, Takehiko Instrumentation and Methods for Astrophysics We have been developing a CdZnTe immersion grating for a compact high-dispersion mid-infrared spectrometer (wavelength range 10--18 $μ$m, spectral resolution $R = λ/Δλ> 25,000$, operating temperature $T < 20$ K). Using an immersion grating, the spectrometer size can be reduced to $1/n$ ($n$: refractive index) compared to conventional diffraction gratings. CdZnTe is promising as a material for immersion gratings for the wavelength range. However, the refractive index $n$ of CdZnTe has not been measured at $T < 20$ K. We have been developing a system to precisely measure $n$ at cryogenic temperatures ($T \sim 10$ K) in the mid-infrared wavelength range. As the first result, this paper reports the temperature dependence of $n$ of CdZnTe at the wavelength of 10.68 $μ$m. This system employs the minimum deviation method. The refractive index $n$ of CdZnTe is measured at temperatures of \( T = 12.57, 22.47, 50.59, 70.57, \text{ and } 298 \, \text{K} \). We find that $n$ of CdZnTe at $λ=$ 10.68 $μ$m is $2.6371 \pm 0.0022$ at $12.57 \pm 0.14$ K, and the average temperature dependence of $n$ between 12.57 $\pm$ 0.14 K and 70.57 $\pm$ 0.23 K is $Δn/ΔT = (5.8 \pm 0.3) \times 10^{-5}$ K$^{-1}$. |
| title | Measurement of the Temperature Dependence of the Refractive Index of CdZnTe |
| topic | Instrumentation and Methods for Astrophysics |
| url | https://arxiv.org/abs/2504.16388 |