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| Main Authors: | , , , , , , , , , |
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| Format: | Preprint |
| Published: |
2026
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| Subjects: | |
| Online Access: | https://arxiv.org/abs/2602.08056 |
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Table of Contents:
- Contact electrification (CE) remains a critical challenge in advanced material technologies where uncontrolled surface charging can compromise manufacturability, reliability, and performance in practical applications. Ultrathin glass with micrometer-scale thickness is a state-of-the-art specialty oxide material for flexible touchscreens in next-generation electronic devices. Here, we visualize and quantify CE-induced surface charges on ultrathin glass using sideband-mode Kelvin probe force microscopy (KPFM). Nanoscale atomic force microscopy (AFM) probes are used to scan and induce triboelectric charges on stand-alone glass surfaces under ultra-pure N$_2$ conditions. Time-dependent measurements reveal that surface charges on a 30~$μ$m-thick glass sample decay from 4.47~V to 0.37~V over 240~minutes. Furthermore, electrostatic charges are found to exhibit capacitor-like discharging behavior primarily through the bulk material, yielding a long relaxation time constant of approximately 41~minutes. This behavior differs from the lateral surface discharging observed in thermally grown SiO$2$ thin films reported previously. A self-capacitance analytical model is developed to estimate the corresponding surface charge density ($σ$), yielding comparable values of 136.26~$\pm$~16.25~$μ$C/m$^2$ at 30~$μ$m and 131.44~$\pm$~28.41~$μ$C/m$^2$ at 100~$μ$m. Additionally, external bias applied to AFM tips can be used to enhance, suppress, or invert the intrinsic CE response of glass materials.