Yi, L., Ito, S., Tang, C., Nishida, Y., Terumoto, K., Maeda, T., . . . Fujita, M. (2026). Micrometer-scale displacement and thickness sensing using a single terahertz resonant-tunneling diode.
Cita Chicago (17th ed.)Yi, Li, Shota Ito, Chao Tang, Yousuke Nishida, Koji Terumoto, Toshihisa Maeda, Yuta Inose, i Masayuki Fujita. Micrometer-scale Displacement and Thickness Sensing Using a Single Terahertz Resonant-tunneling Diode. 2026.
Cita MLA (9th ed.)Yi, Li, et al. Micrometer-scale Displacement and Thickness Sensing Using a Single Terahertz Resonant-tunneling Diode. 2026.
Atenció: Aquestes cites poden no estar 100% correctes.