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| Main Authors: | , , , , , , , |
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| Formato: | Preprint |
| Publicado em: |
2026
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| Assuntos: | |
| Acesso em linha: | https://arxiv.org/abs/2602.23621 |
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| _version_ | 1866913040215048192 |
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| author | Yi, Li Ito, Shota Tang, Chao Nishida, Yousuke Terumoto, Koji Maeda, Toshihisa Inose, Yuta Fujita, Masayuki |
| author_facet | Yi, Li Ito, Shota Tang, Chao Nishida, Yousuke Terumoto, Koji Maeda, Toshihisa Inose, Yuta Fujita, Masayuki |
| contents | Resonant tunneling diodes (RTDs) support room-temperature terahertz (THz) oscillation and simultaneous THz-band detection, enabling compact monostatic THz sensors for practical and cost-effective sensing applications. In this paper, we present a highly integrated 280 GHz-band radar system based on a single RTD that exploits the self-mixing effect to generate a low-frequency interferometric signal. The resulting self-mixing signal is further analyzed from a radar perspective and processed to extract micrometer-scale displacement and thin-film thickness variations. Experimentally, the proposed system demonstrates a minimum detectable displacement of approximately 5 um and quantitatively resolves polymer film thicknesses of 12.5, 25, and 50 um. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2602_23621 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Micrometer-scale displacement and thickness sensing using a single terahertz resonant-tunneling diode Yi, Li Ito, Shota Tang, Chao Nishida, Yousuke Terumoto, Koji Maeda, Toshihisa Inose, Yuta Fujita, Masayuki Optics Hardware Architecture Resonant tunneling diodes (RTDs) support room-temperature terahertz (THz) oscillation and simultaneous THz-band detection, enabling compact monostatic THz sensors for practical and cost-effective sensing applications. In this paper, we present a highly integrated 280 GHz-band radar system based on a single RTD that exploits the self-mixing effect to generate a low-frequency interferometric signal. The resulting self-mixing signal is further analyzed from a radar perspective and processed to extract micrometer-scale displacement and thin-film thickness variations. Experimentally, the proposed system demonstrates a minimum detectable displacement of approximately 5 um and quantitatively resolves polymer film thicknesses of 12.5, 25, and 50 um. |
| title | Micrometer-scale displacement and thickness sensing using a single terahertz resonant-tunneling diode |
| topic | Optics Hardware Architecture |
| url | https://arxiv.org/abs/2602.23621 |