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Main Authors: Yi, Li, Ito, Shota, Tang, Chao, Nishida, Yousuke, Terumoto, Koji, Maeda, Toshihisa, Inose, Yuta, Fujita, Masayuki
Formato: Preprint
Publicado em: 2026
Assuntos:
Acesso em linha:https://arxiv.org/abs/2602.23621
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author Yi, Li
Ito, Shota
Tang, Chao
Nishida, Yousuke
Terumoto, Koji
Maeda, Toshihisa
Inose, Yuta
Fujita, Masayuki
author_facet Yi, Li
Ito, Shota
Tang, Chao
Nishida, Yousuke
Terumoto, Koji
Maeda, Toshihisa
Inose, Yuta
Fujita, Masayuki
contents Resonant tunneling diodes (RTDs) support room-temperature terahertz (THz) oscillation and simultaneous THz-band detection, enabling compact monostatic THz sensors for practical and cost-effective sensing applications. In this paper, we present a highly integrated 280 GHz-band radar system based on a single RTD that exploits the self-mixing effect to generate a low-frequency interferometric signal. The resulting self-mixing signal is further analyzed from a radar perspective and processed to extract micrometer-scale displacement and thin-film thickness variations. Experimentally, the proposed system demonstrates a minimum detectable displacement of approximately 5 um and quantitatively resolves polymer film thicknesses of 12.5, 25, and 50 um.
format Preprint
id arxiv_https___arxiv_org_abs_2602_23621
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Micrometer-scale displacement and thickness sensing using a single terahertz resonant-tunneling diode
Yi, Li
Ito, Shota
Tang, Chao
Nishida, Yousuke
Terumoto, Koji
Maeda, Toshihisa
Inose, Yuta
Fujita, Masayuki
Optics
Hardware Architecture
Resonant tunneling diodes (RTDs) support room-temperature terahertz (THz) oscillation and simultaneous THz-band detection, enabling compact monostatic THz sensors for practical and cost-effective sensing applications. In this paper, we present a highly integrated 280 GHz-band radar system based on a single RTD that exploits the self-mixing effect to generate a low-frequency interferometric signal. The resulting self-mixing signal is further analyzed from a radar perspective and processed to extract micrometer-scale displacement and thin-film thickness variations. Experimentally, the proposed system demonstrates a minimum detectable displacement of approximately 5 um and quantitatively resolves polymer film thicknesses of 12.5, 25, and 50 um.
title Micrometer-scale displacement and thickness sensing using a single terahertz resonant-tunneling diode
topic Optics
Hardware Architecture
url https://arxiv.org/abs/2602.23621