Saved in:
Bibliographic Details
Format: Revista científica
Language:EN
Published: MDPI AG 2022
Subjects:
Online Access:https://doaj.org/toc/2673-8244
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1866826662249758720
format Revista científica
id doaj_https___doaj_org_toc_2673-8244
institution DOAJ
language EN
publishDate 2022
publisher MDPI AG
record_format doaj
spellingShingle Metrology
cyberphysical systems
machine learning for metrology
metrology for sustainable manufacturing
measurement uncertainty in dynamic processes
Electronic computers. Computer science
QA75.5-76.95
Applied mathematics. Quantitative methods
T57-57.97
title Metrology
topic cyberphysical systems
machine learning for metrology
metrology for sustainable manufacturing
measurement uncertainty in dynamic processes
Electronic computers. Computer science
QA75.5-76.95
Applied mathematics. Quantitative methods
T57-57.97
url https://doaj.org/toc/2673-8244