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Bibliographic Details
Main Authors: Zhu, Ruizhi, Guo, Yanan, Li, Fan, Gao, Congming, Xin, Xin
Format: Recurso digital
Language:English
Published: Zenodo 2026
Online Access:https://doi.org/10.5281/zenodo.19635493
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  • <p>Artifact package for the paper "BRACE: Burst-Resilient Architecture for Chip-level ECC in DDR5".</p> <p>This artifact contains the code, scripts, configuration files, and instructions needed to reproduce the main experimental results reported in the paper, including performance, power, and reliability evaluations. The package is intended for the SC reproducibility appendix and artifact review process.</p>