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Bibliographic Details
Main Author: Liu, Weiwei
Format: Recurso digital
Language:English
Published: Zenodo 2015
Subjects:
Online Access:https://doi.org/10.5281/zenodo.20131815
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author Liu, Weiwei
author_facet Liu, Weiwei
contents
format Recurso digital
id zenodo_https___doi_org_10_5281_zenodo_20131815
institution Zenodo
language eng
publishDate 2015
publisher Zenodo
record_format zenodo
spellingShingle PlantPhenomics_model_review_package
Liu, Weiwei
Remote Sensing
Quantitative mapping
Rice bacterial leaf blight

title PlantPhenomics_model_review_package
topic Remote Sensing
Quantitative mapping
Rice bacterial leaf blight
url https://doi.org/10.5281/zenodo.20131815