Ngā tūemi rite

• Experimental Investigation of Drain Noise in High Electron Mobility Transistors: Thermal and Hot Electron Noise
  mā: Gabritchidze, Bekari, me ētahi atu.
  I whakaputaina: (2022)
• SiGe BiCMOS Circuit Design using only PMOS and HBTs Approach for the Ocean Worlds Exploration
  mā: Faruk, Md Omar, me ētahi atu.
  I whakaputaina: (2024)
• Variable-temperature attenuator calibration method for on-wafer microwave noise characterization of low-noise amplifiers
  mā: Ardizzi, Anthony J., me ētahi atu.
  I whakaputaina: (2025)
• Radiation Tolerance of SiGe BiCMOS Monolithic Silicon Pixel Detectors without Internal Gain Layer
  mā: Milanesio, M., me ētahi atu.
  I whakaputaina: (2023)
• Testbeam Characterization of a SiGe BiCMOS Monolithic Silicon Pixel Detector with Internal Gain Layer
  mā: Paolozzi, L., me ētahi atu.
  I whakaputaina: (2024)