Documenti analoghi

• Experimental Investigation of Drain Noise in High Electron Mobility Transistors: Thermal and Hot Electron Noise
  di: Gabritchidze, Bekari, et al.
  Pubblicazione: (2022)
• SiGe BiCMOS Circuit Design using only PMOS and HBTs Approach for the Ocean Worlds Exploration
  di: Faruk, Md Omar, et al.
  Pubblicazione: (2024)
• Variable-temperature attenuator calibration method for on-wafer microwave noise characterization of low-noise amplifiers
  di: Ardizzi, Anthony J., et al.
  Pubblicazione: (2025)
• Radiation Tolerance of SiGe BiCMOS Monolithic Silicon Pixel Detectors without Internal Gain Layer
  di: Milanesio, M., et al.
  Pubblicazione: (2023)
• Testbeam Characterization of a SiGe BiCMOS Monolithic Silicon Pixel Detector with Internal Gain Layer
  di: Paolozzi, L., et al.
  Pubblicazione: (2024)