Suchergebnisse - Carsten Hartmann

Light Extraction and External Quantum Efficiency of 235 nm Far–Ultraviolet‐C Light‐Emitting Diodes on Single‐Crystal AlN Substrates von Marcel Schilling, Carsten Hartmann, Martin Guttmann, Uta Juda, Anton Muhin, Jakob Höpfner, Tim Wernicke, Thomas Straubinger, Michael Kneissl

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Comparative Study of Residual Stress and Defects in Single‐Crystalline (0001) AlN Wafers by Scanning Infrared Depolarization and White‐Beam X‐ray Topography von Martin Herms, Merve Pinar Kabukcuoglu, Carsten Hartmann, Markus Stöhr, Matthias Wagner, Elias Hamann, Daniel Hänschke, Carsten Richter, Thomas Straubinger

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