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    The Principles and Applications of Electrical Characterization Techniques for Electrically Active Defects in 4H‐SiC Devices by Lan Luo, Yu Zhong, Kuan Yew Cheong, Rui Zhang, Tianlu Wang, Dengwen Yuan, Handoko Linewih, Shuqiang Li, Yingxin Cui, Mingsheng Xu, Xiangang Xu, Jisheng Han

    Published 2025
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    Artículo Open Access

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