Search Results - Innocent Toendepi

  • Showing 1 - 1 results of 1
Refine Results
  1. 1
    Cover Image

    Temperature‐Mediated Defect Engineering in Cu 2‐x S for Tailoring Dielectric Response Properties Autoría: Bo Sun, Zhao Yang, Jinyao Yin, Hui‐Ya Wang, Tian Mai, Innocent Toendepi, Qian Chen, Juan Matmin, Yaofeng Zhu

    Published 2026
    Fuente: Wiley Open Access
    Tipo de material: Artículo Open Access
    Acceso al recurso
    Enlace del recurso

    Save to List
    Saved in:

Search Tools: