Characterizing Universal Gate Sets via Dihedral Benchmarking

Fuente: arXiv
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Hauptverfasser: Carignan-Dugas, Arnaud, Wallman, Joel J., Emerson, Joseph
Format: Preprint
Veröffentlicht: 2015
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author Carignan-Dugas, Arnaud
Wallman, Joel J.
Emerson, Joseph
author_facet Carignan-Dugas, Arnaud
Wallman, Joel J.
Emerson, Joseph
contents We describe a practical experimental protocol for robustly characterizing the error rates of non-Clifford gates associated with dihedral groups, including gates in SU(2) associated with arbitrarily small angle rotations. Our dihedral benchmarking protocol is a generalization of randomized benchmarking that relaxes the usual unitary 2-design condition. Combining this protocol with existing randomized benchmarking schemes enables an efficient means of characterizing universal gate sets for quantum information processing in a way that is independent of state-preparation and measurement errors. In particular, our protocol enables direct benchmarking of the $T$ gate (sometime called $π/8$-gate) even for the gate-dependent error model that is expected in leading approaches to fault-tolerant quantum computation.
format Preprint
id arxiv_https___arxiv_org_abs_1508_06312
institution arXiv
publishDate 2015
record_format arxiv
spellingShingle Characterizing Universal Gate Sets via Dihedral Benchmarking
Carignan-Dugas, Arnaud
Wallman, Joel J.
Emerson, Joseph
Quantum Physics
We describe a practical experimental protocol for robustly characterizing the error rates of non-Clifford gates associated with dihedral groups, including gates in SU(2) associated with arbitrarily small angle rotations. Our dihedral benchmarking protocol is a generalization of randomized benchmarking that relaxes the usual unitary 2-design condition. Combining this protocol with existing randomized benchmarking schemes enables an efficient means of characterizing universal gate sets for quantum information processing in a way that is independent of state-preparation and measurement errors. In particular, our protocol enables direct benchmarking of the $T$ gate (sometime called $π/8$-gate) even for the gate-dependent error model that is expected in leading approaches to fault-tolerant quantum computation.
title Characterizing Universal Gate Sets via Dihedral Benchmarking
topic Quantum Physics
url https://arxiv.org/abs/1508.06312