Measurement of the charged pion mass using X-ray spectroscopy of exotic atoms

Fuente: arXiv

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Bibliographic Details
Main Authors:	Trassinelli, M, Anagnostopoulos, D. F., Borchert, G., Dax, A., Egger, J. P, Gotta, D., Hennebach, M., Indelicato, P., Liu, Y. -W., Manil, B., Nelms, N., Simons, L. M., Wells, A.
Format:	Preprint
Published:	2016
Subjects:	Atomic Physics Instrumentation and Detectors
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/1605.03300