Study of domain switching using piezoresponse force microscopy in Ca0.4Sr0.6Bi4Ti4O15 thin film for electromechanical applications

Fuente: arXiv
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Autores principales: Mitra, Supratim, Gupta, Satakshi, Joseph, Aneesh M., Dwivedi, Umesh Kumar
Formato: Preprint
Publicado: 2018
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_version_ 1866908344435867648
author Mitra, Supratim
Gupta, Satakshi
Joseph, Aneesh M.
Dwivedi, Umesh Kumar
author_facet Mitra, Supratim
Gupta, Satakshi
Joseph, Aneesh M.
Dwivedi, Umesh Kumar
contents An attempt has been made to synthesize (Ca0.4Sr0.6)Bi4Ti4O15(CSBT) thin film using pulsed laser deposition (PLD) and successfully optimized the deposition conditions. A good quality film with the desired phase is obtained at a substrate temperature of 650 oC based on phase, composition and morphology studies. Highly c-axis oriented films with average thickness 330-400 nm and an average grain size 40-65 nm has been found. Piezoresponse force microscopy (PFM) showed a complete domain reversal using switching spectroscopy. A comparatively high effective d33* value as ~120 pm/V has been achived. The results suggest that CSBT has a great potential in electromechanical applications.
format Preprint
id arxiv_https___arxiv_org_abs_1810_02192
institution arXiv
publishDate 2018
record_format arxiv
spellingShingle Study of domain switching using piezoresponse force microscopy in Ca0.4Sr0.6Bi4Ti4O15 thin film for electromechanical applications
Mitra, Supratim
Gupta, Satakshi
Joseph, Aneesh M.
Dwivedi, Umesh Kumar
Materials Science
An attempt has been made to synthesize (Ca0.4Sr0.6)Bi4Ti4O15(CSBT) thin film using pulsed laser deposition (PLD) and successfully optimized the deposition conditions. A good quality film with the desired phase is obtained at a substrate temperature of 650 oC based on phase, composition and morphology studies. Highly c-axis oriented films with average thickness 330-400 nm and an average grain size 40-65 nm has been found. Piezoresponse force microscopy (PFM) showed a complete domain reversal using switching spectroscopy. A comparatively high effective d33* value as ~120 pm/V has been achived. The results suggest that CSBT has a great potential in electromechanical applications.
title Study of domain switching using piezoresponse force microscopy in Ca0.4Sr0.6Bi4Ti4O15 thin film for electromechanical applications
topic Materials Science
url https://arxiv.org/abs/1810.02192