Thermal Boundary Resistance Measurement and Analysis Across SiC/SiO2 Interface

Fuente: arXiv

Saved in:

Bibliographic Details
Main Authors:	Deng, Shichen, Xiao, Chengdi, Yuan, Jiale, Ma, Dengke, Li, Junhui, Yang, Nuo, He, Hu
Format:	Preprint
Published:	2019
Subjects:	Applied Physics Mesoscale and Nanoscale Physics
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet

https://arxiv.org/abs/1905.08570