Copertina

Thermal Boundary Resistance Measurement and Analysis Across SiC/SiO2 Interface

Fuente: arXiv

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Dettagli Bibliografici
Autori principali:	Deng, Shichen, Xiao, Chengdi, Yuan, Jiale, Ma, Dengke, Li, Junhui, Yang, Nuo, He, Hu
Natura:	Preprint
Pubblicazione:	2019
Soggetti:	Applied Physics Mesoscale and Nanoscale Physics
Accesso online:	Acceder al recurso
Tags:	Aggiungi Tag Nessun Tag, puoi essere il primo ad aggiungerne!!

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