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Thermal Boundary Resistance Measurement and Analysis Across SiC/SiO2 Interface

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Deng, Shichen, Xiao, Chengdi, Yuan, Jiale, Ma, Dengke, Li, Junhui, Yang, Nuo, He, Hu
Formato:	Preprint
Publicado:	2019
Materias:	Applied Physics Mesoscale and Nanoscale Physics
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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