Source Shot Noise Mitigation in Focused Ion Beam Microscopy by Time-Resolved Measurement

Fuente: arXiv

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Bibliographic Details
Main Authors:	Peng, Minxu, Murray-Bruce, John, Berggren, Karl K., Goyal, Vivek K
Format:	Preprint
Published:	2019
Subjects:	Materials Science Instrumentation and Detectors
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/1906.03285