Nikolaev, K. V., Soltwisch, V., Hoenicke, P., Scholze, F., de la Rie, J., Yakunin, S. N., . . . Bijkerk, F. (2019). A semi-analytical approach for the characterization of ordered 3D nano structures using grazing-incidence X-ray fluorescence.
Chicago Style (17th ed.) CitationNikolaev, K. V., V. Soltwisch, P. Hoenicke, F. Scholze, J. de la Rie, S. N. Yakunin, I. A. Makhotkin, R. W. E. van de Kruijs, and F. Bijkerk. A Semi-analytical Approach for the Characterization of Ordered 3D Nano Structures Using Grazing-incidence X-ray Fluorescence. 2019.
MLA (9th ed.) CitationNikolaev, K. V., et al. A Semi-analytical Approach for the Characterization of Ordered 3D Nano Structures Using Grazing-incidence X-ray Fluorescence. 2019.
Warning: These citations may not always be 100% accurate.