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A semi-analytical approach for the characterization of ordered 3D nano structures using grazing-incidence X-ray fluorescence

Fuente: arXiv
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Bibliographic Details
Main Authors: Nikolaev, K. V., Soltwisch, V., Hoenicke, P., Scholze, F., de la Rie, J., Yakunin, S. N., Makhotkin, I. A., van de Kruijs, R. W. E., Bijkerk, F.
Format: Preprint
Published: 2019
Subjects:
Computational Physics
Mesoscale and Nanoscale Physics
Optics
Online Access:
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