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A semi-analytical approach for the characterization of ordered 3D nano structures using grazing-incidence X-ray fluorescence

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Nikolaev, K. V., Soltwisch, V., Hoenicke, P., Scholze, F., de la Rie, J., Yakunin, S. N., Makhotkin, I. A., van de Kruijs, R. W. E., Bijkerk, F.
Formato:	Preprint
Publicado:	2019
Materias:	Computational Physics Mesoscale and Nanoscale Physics Optics
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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