Optical excitation of atomic force microscopy cantilever for accurate spectroscopic measurements
Fuente:
arXiv
Saved in:
| Main Authors: | Miyahara, Yoichi, Griffin, Harrisonn, Roy-Gobeil, Antoine, Belyansky, Ron, Bergeron, Hadallia, Bustamante, José, Grutter, Peter |
|---|---|
| Format: | Preprint |
| Published: |
2019
|
| Subjects: | |
| Online Access: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
Control of quality factor of atomic force microscopy cantilever by cavity optomechanical effect
by: Austin-Bingamon, Noah, et al.
Published: (2024)
by: Austin-Bingamon, Noah, et al.
Published: (2024)
Needle in a haystack: efficiently finding atomically defined quantum dots for electrostatic force microscopy
by: Bustamante, José, et al.
Published: (2024)
by: Bustamante, José, et al.
Published: (2024)
Atomic observation on diamond (001) surfaces with non-contact atomic force microscopy
by: Zhang, Runnan, et al.
Published: (2024)
by: Zhang, Runnan, et al.
Published: (2024)
Nanopatterning of multicomponent van der Waals heterostructures using atomic force microscopy
by: Shilov, A. L., et al.
Published: (2024)
by: Shilov, A. L., et al.
Published: (2024)
Improving the electrical conductivity of Pt nanowires deposited by focused electron beam induced deposition using thermal annealing
by: Rai, Rajendra, et al.
Published: (2026)
by: Rai, Rajendra, et al.
Published: (2026)
Lateral force microscopy calibration using an interferometric atomic force microscope
by: Lefever, Joel, et al.
Published: (2025)
by: Lefever, Joel, et al.
Published: (2025)
High-speed quantitative nanomechanical mapping by photothermal off-resonance atomic force microscopy
by: Gunstheimer, Hans, et al.
Published: (2025)
by: Gunstheimer, Hans, et al.
Published: (2025)
DPmoire: A tool for constructing accurate machine learning force fields in moiré systems
by: Liu, Jiaxuan, et al.
Published: (2024)
by: Liu, Jiaxuan, et al.
Published: (2024)
First-principles investigation of magnetic exchange force microscopy on adatoms adsorbed on an antiferromagnetic surface
by: Haldar, Soumyajyoti, et al.
Published: (2024)
by: Haldar, Soumyajyoti, et al.
Published: (2024)
Magnetic force microscopy versus scanning quantum-vortex microscopy: Probing pinning landscape in granular niobium films
by: Aladyshkin, A. Yu., et al.
Published: (2025)
by: Aladyshkin, A. Yu., et al.
Published: (2025)
Thermal noise calibration of functionalized cantilevers for force microscopy: effects of the colloidal probe position
by: Archambault, Aubin, et al.
Published: (2023)
by: Archambault, Aubin, et al.
Published: (2023)
An extensive thermal conductivity measurement method based on atomic force microscopy
by: Kasırga, T. Serkan, et al.
Published: (2025)
by: Kasırga, T. Serkan, et al.
Published: (2025)
The spin-switch scanning tunneling microscopy: an architecture to probe electron-phonon interactions in the atomic scale
by: Song, Dezhi, et al.
Published: (2024)
by: Song, Dezhi, et al.
Published: (2024)
Johnson-noise-limited cancellation-free microwave impedance microscopy with monolithic silicon cantilever probes
by: Shan, Jun-Yi, et al.
Published: (2024)
by: Shan, Jun-Yi, et al.
Published: (2024)
Ultra-long-range spin coupling in graphene revealed by atomically resolved spin excitations
by: Viña-Bausá, Beatriz, et al.
Published: (2025)
by: Viña-Bausá, Beatriz, et al.
Published: (2025)
Local probing of superconductivity at oxide interfaces with atomic force microscopy
by: Yildiz, Dilek, et al.
Published: (2026)
by: Yildiz, Dilek, et al.
Published: (2026)
Spatially resolved random telegraph fluctuations of a single trap at the Si/SiO2 interface
by: Cowie, Megan, et al.
Published: (2024)
by: Cowie, Megan, et al.
Published: (2024)
Exploring structure diversity in atomic resolution microscopy with graph neural networks
by: Luo, Zheng, et al.
Published: (2024)
by: Luo, Zheng, et al.
Published: (2024)
Electrostatic transfer of sub-micron magnetic particles onto cantilevers using a focused ion beam system
by: Sun, Peter, et al.
Published: (2026)
by: Sun, Peter, et al.
Published: (2026)
Local atomic stacking and symmetry in twisted graphene trilayers
by: Craig, Isaac M., et al.
Published: (2023)
by: Craig, Isaac M., et al.
Published: (2023)
An active metasurface enhanced with moiré ferroelectricity
by: Kim, Dong Seob, et al.
Published: (2024)
by: Kim, Dong Seob, et al.
Published: (2024)
Defect complexes in CrSBr revealed through electron microscopy and deep learning
by: Weile, Mads, et al.
Published: (2025)
by: Weile, Mads, et al.
Published: (2025)
Hidden time-reversal in driven XXZ spin chains: exact solutions and new dissipative phase transitions
by: Yao, Mingxing, et al.
Published: (2024)
by: Yao, Mingxing, et al.
Published: (2024)
Probing Electrocatalytic Gas Evolution Reaction at Pt by Force Noise Measurements. Part 2. Oxygen
by: Bodappa, Nataraju, et al.
Published: (2025)
by: Bodappa, Nataraju, et al.
Published: (2025)
Investigation of filamentation in a-Si/Ag/Cu memristors with atomic force microscope
by: Samsonova, Alena, et al.
Published: (2026)
by: Samsonova, Alena, et al.
Published: (2026)
Atomic-resolution structural and spectroscopic evidence for the synthetic realization of two-dimensional copper boride
by: Li, Hui, et al.
Published: (2025)
by: Li, Hui, et al.
Published: (2025)
Time-resolved x-ray microscopy for materials science
by: Wen, Haidan, et al.
Published: (2018)
by: Wen, Haidan, et al.
Published: (2018)
Wave-mixing cathodoluminescence microscopy of low-frequency excitations
by: Prelat, Leila, et al.
Published: (2025)
by: Prelat, Leila, et al.
Published: (2025)
Symmetries of all lines in monolayer crystals
by: Field, Bernard, et al.
Published: (2024)
by: Field, Bernard, et al.
Published: (2024)
Enhanced magnetic dichroism in darkfield UV photoemission electron microscopy
by: Paleschke, Maximilian, et al.
Published: (2024)
by: Paleschke, Maximilian, et al.
Published: (2024)
Nanoscale wireframe SQUID on a cantilever by corner lithography
by: Roskamp, Thijs J., et al.
Published: (2026)
by: Roskamp, Thijs J., et al.
Published: (2026)
Is the atomic quadrupole moment of a carbon atom in graphene zero?: The case for a rational definition of the properties of atoms in a molecule
by: Mulvey, Devin M., et al.
Published: (2025)
by: Mulvey, Devin M., et al.
Published: (2025)
Simulating bistable current-induced switching of metallic atomic contacts by electron-vibration scattering
by: Ring, Markus, et al.
Published: (2023)
by: Ring, Markus, et al.
Published: (2023)
Electrode modified domain morphology in ferroelectric capacitors revealed by X-ray microscopy
by: Landberg, Megan O. Hill, et al.
Published: (2025)
by: Landberg, Megan O. Hill, et al.
Published: (2025)
Beam induced heating in electron microscopy modeled with machine learning interatomic potentials
by: Valencia, Cuauhtemoc Nuñez, et al.
Published: (2023)
by: Valencia, Cuauhtemoc Nuñez, et al.
Published: (2023)
Direct probing the quantum geometric tensor for bosonic collective excitations
by: Wu, Chi, et al.
Published: (2026)
by: Wu, Chi, et al.
Published: (2026)
On determining the energy dispersion of spin excitations with scanning tunneling spectroscopy
by: Henriques, J. C. G., et al.
Published: (2025)
by: Henriques, J. C. G., et al.
Published: (2025)
Elementary excitations of single-photon emitters in hexagonal Boron Nitride
by: Pelliciari, Jonathan, et al.
Published: (2024)
by: Pelliciari, Jonathan, et al.
Published: (2024)
Raman scattering excitation in monolayers of semiconducting transition metal dichalcogenides
by: Zinkiewicz, M., et al.
Published: (2023)
by: Zinkiewicz, M., et al.
Published: (2023)
All optical excitation of spin polarization in d-wave altermagnets
by: Weber, Marius, et al.
Published: (2024)
by: Weber, Marius, et al.
Published: (2024)
Similar Items
-
Control of quality factor of atomic force microscopy cantilever by cavity optomechanical effect
by: Austin-Bingamon, Noah, et al.
Published: (2024) -
Needle in a haystack: efficiently finding atomically defined quantum dots for electrostatic force microscopy
by: Bustamante, José, et al.
Published: (2024) -
Atomic observation on diamond (001) surfaces with non-contact atomic force microscopy
by: Zhang, Runnan, et al.
Published: (2024) -
Nanopatterning of multicomponent van der Waals heterostructures using atomic force microscopy
by: Shilov, A. L., et al.
Published: (2024) -
Improving the electrical conductivity of Pt nanowires deposited by focused electron beam induced deposition using thermal annealing
by: Rai, Rajendra, et al.
Published: (2026)