A Novel Visual Fault Detection and Classification System for Semiconductor Manufacturing Using Stacked Hybrid Convolutional Neural Networks

Fuente: arXiv

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Bibliographic Details
Main Authors:	Schlosser, Tobias, Beuth, Frederik, Friedrich, Michael, Kowerko, Danny
Format:	Preprint
Published:	2019
Subjects:	Machine Learning Computer Vision and Pattern Recognition Image and Video Processing
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/1911.11250