Nanometric precision distance metrology via chip-scale soliton microcombs
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arXiv
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| Autori principali: | , , , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2020
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| _version_ | 1866929583946727424 |
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| author | Jang, Yoon-Soo Liu, Hao Yang, Jinghui Yu, Mingbin Kwong, Dim-Lee Wong, Chee Wei |
| author_facet | Jang, Yoon-Soo Liu, Hao Yang, Jinghui Yu, Mingbin Kwong, Dim-Lee Wong, Chee Wei |
| contents | Laser interferometry serves a fundamental role in science and technology, assisting precision metrology and dimensional length measurement. During the past decade, laser frequency combs - a coherent optical-microwave frequency ruler over a broad spectral range with traceability to time-frequency standards - have contributed pivotal roles in laser dimensional metrology with ever-growing demands in measurement precision. Here we report spectrally-resolved laser dimensional metrology via a soliton frequency microcomb, with nanometric-scale precision. Spectral interferometry provides information on the optical time-of-flight signature, and the large free-spectral range and high-coherence of the microcomb enables tooth-resolved and high-visibility interferograms that can be directly readout with optical spectrum instrumentation. We employ a hybrid timing signal from comb-line homodyne interferometry and microcomb spectrally-resolved interferometry - all from the same spectral interferogram. Our combined soliton and homodyne architecture demonstrates a 3-nm repeatability achieved via homodyne interferometry, and over 1,000-seconds stability in the long-term precision metrology at the white noise limits. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2003_13222 |
| institution | arXiv |
| publishDate | 2020 |
| record_format | arxiv |
| spellingShingle | Nanometric precision distance metrology via chip-scale soliton microcombs Jang, Yoon-Soo Liu, Hao Yang, Jinghui Yu, Mingbin Kwong, Dim-Lee Wong, Chee Wei Instrumentation and Detectors Applied Physics Optics Laser interferometry serves a fundamental role in science and technology, assisting precision metrology and dimensional length measurement. During the past decade, laser frequency combs - a coherent optical-microwave frequency ruler over a broad spectral range with traceability to time-frequency standards - have contributed pivotal roles in laser dimensional metrology with ever-growing demands in measurement precision. Here we report spectrally-resolved laser dimensional metrology via a soliton frequency microcomb, with nanometric-scale precision. Spectral interferometry provides information on the optical time-of-flight signature, and the large free-spectral range and high-coherence of the microcomb enables tooth-resolved and high-visibility interferograms that can be directly readout with optical spectrum instrumentation. We employ a hybrid timing signal from comb-line homodyne interferometry and microcomb spectrally-resolved interferometry - all from the same spectral interferogram. Our combined soliton and homodyne architecture demonstrates a 3-nm repeatability achieved via homodyne interferometry, and over 1,000-seconds stability in the long-term precision metrology at the white noise limits. |
| title | Nanometric precision distance metrology via chip-scale soliton microcombs |
| topic | Instrumentation and Detectors Applied Physics Optics |
| url | https://arxiv.org/abs/2003.13222 |