Wang, W., & Prabhakar, S. (2020). Error analysis of bit-flip qubits under random telegraph noise for low and high temperature measurement application.
Chicago Style (17th ed.) CitationWang, Win, and Sanjay Prabhakar. Error Analysis of Bit-flip Qubits Under Random Telegraph Noise for Low and High Temperature Measurement Application. 2020.
MLA (9th ed.) CitationWang, Win, and Sanjay Prabhakar. Error Analysis of Bit-flip Qubits Under Random Telegraph Noise for Low and High Temperature Measurement Application. 2020.
Warning: These citations may not always be 100% accurate.