A multi-technique approach to understanding delithiation damage in LiCoO2 thin films

Fuente: arXiv

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Bibliographic Details
Main Authors:	Salagre, E., Quilez, S., de Benito, R., Jaafar, M., van der Meulen, H. P., Vasco, E., Cid, R., Fuller, E. J., Talin, A. A., Segovia, P., Michel, E. G., Polop, C.
Format:	Preprint
Published:	2020
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2010.14346