Marks, S. D., Quan, P., Liu, R., Highland, M. J., Zhou, H., Keuch, T. F., . . . Evans, P. G. (2020). Instrument for in situ hard x-ray nanobeam characterization during epitaxial crystallization and materials transformations.
Chicago Style (17th ed.) CitationMarks, Samuel D., Peiyu Quan, Rui Liu, Matthew J. Highland, Hua Zhou, Thomas F. Keuch, G. Brian Stephenson, and Paul G. Evans. Instrument for in Situ Hard X-ray Nanobeam Characterization During Epitaxial Crystallization and Materials Transformations. 2020.
MLA (9th ed.) CitationMarks, Samuel D., et al. Instrument for in Situ Hard X-ray Nanobeam Characterization During Epitaxial Crystallization and Materials Transformations. 2020.
Warning: These citations may not always be 100% accurate.