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Deep Ensembling with No Overhead for either Training or Testing: The All-Round Blessings of Dynamic Sparsity

Fuente: arXiv
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Bibliographic Details
Main Authors: Liu, Shiwei, Chen, Tianlong, Atashgahi, Zahra, Chen, Xiaohan, Sokar, Ghada, Mocanu, Elena, Pechenizkiy, Mykola, Wang, Zhangyang, Mocanu, Decebal Constantin
Format: Preprint
Published: 2021
Subjects:
Machine Learning
Computer Vision and Pattern Recognition
Online Access:
Acceder al recurso
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