A graphical multi-fidelity Gaussian process model, with application to emulation of heavy-ion collisions

Fuente: arXiv

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Bibliographic Details
Main Authors:	Ji, Yi, Mak, Simon, Soeder, Derek, Paquet, J-F, Bass, Steffen A.
Format:	Preprint
Published:	2021
Subjects:	Methodology
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2108.00306