Emergent phenomena at oxide interfaces studied with standing-wave photoelectron spectroscopy
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arXiv
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| Format: | Preprint |
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2021
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| author | Kuo, C. -T. Conti, G. Rault, J. E. Schneider, C. M. Nemšák, S. Gray, A. X. |
| author_facet | Kuo, C. -T. Conti, G. Rault, J. E. Schneider, C. M. Nemšák, S. Gray, A. X. |
| contents | Emergent phenomena at complex-oxide interfaces have become a vibrant field of study in the past two decades due to the rich physics and a wide range of possibilities for creating new states of matter and novel functionalities for potential devices. Electronic-structural characterization of such phenomena presents a unique challenge due to the lack of direct yet non-destructive techniques for probing buried layers and interfaces with the required Angstrom-level resolution, as well as element and orbital specificity. In this review article, we survey several recent studies wherein soft x-ray standing-wave photoelectron spectroscopy, a relatively newly developed technique, is used to investigate buried oxide interfaces exhibiting emergent phenomena such as metal-insulator transition, interfacial ferromagnetism, and two-dimensional electron gas. Advantages, challenges, and future applications of this methodology are also discussed. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2110_14458 |
| institution | arXiv |
| publishDate | 2021 |
| record_format | arxiv |
| spellingShingle | Emergent phenomena at oxide interfaces studied with standing-wave photoelectron spectroscopy Kuo, C. -T. Conti, G. Rault, J. E. Schneider, C. M. Nemšák, S. Gray, A. X. Materials Science Emergent phenomena at complex-oxide interfaces have become a vibrant field of study in the past two decades due to the rich physics and a wide range of possibilities for creating new states of matter and novel functionalities for potential devices. Electronic-structural characterization of such phenomena presents a unique challenge due to the lack of direct yet non-destructive techniques for probing buried layers and interfaces with the required Angstrom-level resolution, as well as element and orbital specificity. In this review article, we survey several recent studies wherein soft x-ray standing-wave photoelectron spectroscopy, a relatively newly developed technique, is used to investigate buried oxide interfaces exhibiting emergent phenomena such as metal-insulator transition, interfacial ferromagnetism, and two-dimensional electron gas. Advantages, challenges, and future applications of this methodology are also discussed. |
| title | Emergent phenomena at oxide interfaces studied with standing-wave photoelectron spectroscopy |
| topic | Materials Science |
| url | https://arxiv.org/abs/2110.14458 |