Fluctuation-Dissipation in Thermoelectrics
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arXiv
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| Autori principali: | , , , , , , , , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2022
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| _version_ | 1866913309146480640 |
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| author | Tran, Ngoc Anh Minh Dutt, Aditya Savitha Pulumati, Nithin Bharadwaj Reith, Heiko Hu, Anjun Dumont, Alexandre Nielsch, Kornelius Tremblay, André-Marie Schierning, Gabi Reulet, Bertrand Szkopek, Thomas |
| author_facet | Tran, Ngoc Anh Minh Dutt, Aditya Savitha Pulumati, Nithin Bharadwaj Reith, Heiko Hu, Anjun Dumont, Alexandre Nielsch, Kornelius Tremblay, André-Marie Schierning, Gabi Reulet, Bertrand Szkopek, Thomas |
| contents | Thermoelectric materials exhibit correlated transport of charge and heat. The Johnson-Nyquist noise formula $ 4 k_B T R $ for spectral density of voltage fluctuations accounts for fluctuations associated solely with Ohmic dissipation. Applying the fluctuation-dissipation theorem, we generalize the Johnson-Nyquist formula for thermoelectrics, finding an enhanced voltage fluctuation spectral density $4 k_B T R (1 + ZT)$ at frequencies below a thermal cut-off frequency $f_T$, where $ZT$ is the dimensionless thermoelectric material figure of merit. The origin of the enhancement in voltage noise is thermoelectric coupling of temperature fluctuations. We use a wideband ($f_T\sim1$ kHz), integrated thermoelectric micro-device to experimentally confirm our findings. Measuring the $ZT$ enhanced voltage noise, we experimentally resolve temperature fluctuations with an amplitude of $0.8~μ\mathrm{K} \mathrm{Hz}^{-1/2}$ at a mean temperature of 295 K. We find that thermoelectric devices can be used for thermometry with sufficient resolution to measure the fundamental temperature fluctuations described by the fluctuation-dissipation theorem. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2201_05303 |
| institution | arXiv |
| publishDate | 2022 |
| record_format | arxiv |
| spellingShingle | Fluctuation-Dissipation in Thermoelectrics Tran, Ngoc Anh Minh Dutt, Aditya Savitha Pulumati, Nithin Bharadwaj Reith, Heiko Hu, Anjun Dumont, Alexandre Nielsch, Kornelius Tremblay, André-Marie Schierning, Gabi Reulet, Bertrand Szkopek, Thomas Materials Science Mesoscale and Nanoscale Physics Statistical Mechanics Thermoelectric materials exhibit correlated transport of charge and heat. The Johnson-Nyquist noise formula $ 4 k_B T R $ for spectral density of voltage fluctuations accounts for fluctuations associated solely with Ohmic dissipation. Applying the fluctuation-dissipation theorem, we generalize the Johnson-Nyquist formula for thermoelectrics, finding an enhanced voltage fluctuation spectral density $4 k_B T R (1 + ZT)$ at frequencies below a thermal cut-off frequency $f_T$, where $ZT$ is the dimensionless thermoelectric material figure of merit. The origin of the enhancement in voltage noise is thermoelectric coupling of temperature fluctuations. We use a wideband ($f_T\sim1$ kHz), integrated thermoelectric micro-device to experimentally confirm our findings. Measuring the $ZT$ enhanced voltage noise, we experimentally resolve temperature fluctuations with an amplitude of $0.8~μ\mathrm{K} \mathrm{Hz}^{-1/2}$ at a mean temperature of 295 K. We find that thermoelectric devices can be used for thermometry with sufficient resolution to measure the fundamental temperature fluctuations described by the fluctuation-dissipation theorem. |
| title | Fluctuation-Dissipation in Thermoelectrics |
| topic | Materials Science Mesoscale and Nanoscale Physics Statistical Mechanics |
| url | https://arxiv.org/abs/2201.05303 |