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Scattering Loss in Precision Metrology due to Mirror Roughness

Fuente: arXiv

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Bibliographic Details
Main Authors:	Drori, Yehonathan, Eichholz, Johannes, Edo, Tega, Yamamoto, Hiro, Enomoto, Yutaro, Venugopalan, Gautam, Arai, Koji, Adhikari, Rana X
Format:	Preprint
Published:	2022
Subjects:	Optics Instrumentation and Detectors Quantum Physics
Online Access:	Acceder al recurso
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