Roy, A., Cho, M., & Cha, P. (2022). Factors that control stability, variability, and reliability issues of endurance cycle in ReRAM devices: A phase field study.
Chicago-Zitierstil (17. Ausg.)Roy, Arijit, Min-Gyu Cho, und Pil-Ryung Cha. Factors That Control Stability, Variability, and Reliability Issues of Endurance Cycle in ReRAM Devices: A Phase Field Study. 2022.
MLA-Zitierstil (9. Ausg.)Roy, Arijit, et al. Factors That Control Stability, Variability, and Reliability Issues of Endurance Cycle in ReRAM Devices: A Phase Field Study. 2022.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.