Scalable $\rm Al_2O_3-TiO_2$ Conductive Oxide Interfaces as Defect Reservoirs for Resistive Switching Devices

Fuente: arXiv

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Bibliographic Details
Main Authors:	Li, Yang, Wang, Wei, Zhang, Di, Baskin, Maria, Chen, Aiping, Kvatinsky, Shahar, Yalon, Eilam, Kornblum, Lior
Format:	Preprint
Published:	2022
Subjects:	Applied Physics Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2202.04477