Chen, K., & Ying, M. (2022). Automatic Test Pattern Generation for Robust Quantum Circuit Testing.
Chicago Style (17th ed.) CitationChen, Kean, and Mingsheng Ying. Automatic Test Pattern Generation for Robust Quantum Circuit Testing. 2022.
MLA (9th ed.) CitationChen, Kean, and Mingsheng Ying. Automatic Test Pattern Generation for Robust Quantum Circuit Testing. 2022.
Warning: These citations may not always be 100% accurate.