Cita APA (7a ed.)

Tan, J., Zhang, L., Liu, Y., Li, A., & Wu, Y. (2022). Residue-based Label Protection Mechanisms in Vertical Logistic Regression.

Cita Chicago Style (17a ed.)

Tan, Juntao, Lan Zhang, Yang Liu, Anran Li, y Ye Wu. Residue-based Label Protection Mechanisms in Vertical Logistic Regression. 2022.

Cita MLA (9a ed.)

Tan, Juntao, et al. Residue-based Label Protection Mechanisms in Vertical Logistic Regression. 2022.