Experimental Investigation of Drain Noise in High Electron Mobility Transistors: Thermal and Hot Electron Noise

Fuente: arXiv

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Bibliographic Details
Main Authors:	Gabritchidze, Bekari, Cleary, Kieran A., Readhead, Anthony C., Minnich, Austin J.
Format:	Preprint
Published:	2022
Subjects:	Mesoscale and Nanoscale Physics Applied Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2209.02858