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Experimental Investigation of Drain Noise in High Electron Mobility Transistors: Thermal and Hot Electron Noise

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Gabritchidze, Bekari, Cleary, Kieran A., Readhead, Anthony C., Minnich, Austin J.
Formato:	Preprint
Publicado:	2022
Materias:	Mesoscale and Nanoscale Physics Applied Physics
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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