Bayesian inference of high-purity germanium detector impurities based on capacitance measurements and machine-learning accelerated capacitance calculations

Fuente: arXiv
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Bibliographic Details
Main Authors: Abt, Iris, Gooch, Christopher, Hagemann, Felix, Hauertmann, Lukas, Liu, Xiang, Schulz, Oliver, Schuster, Martin
Format: Preprint
Published: 2022
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