Establishing Epitaxial Connectedness in Multi-Stacking: The Survival of Thru-Holes in Thru-Hole Epitaxy

Fuente: arXiv

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Bibliographic Details
Main Authors:	Lee, Youngjun, Lee, Seungjun, Choi, Jaewu, Kim, Chinkyo, Kwon, Young-Kyun
Format:	Preprint
Published:	2022
Subjects:	Materials Science Applied Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2210.04753