Efficient characterization of qudit logical gates with gate set tomography using an error-free Virtual-Z-gate model

Fuente: arXiv
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Bibliographic Details
Main Authors: Cao, Shuxiang, Lall, Deep, Bakr, Mustafa, Campanaro, Giulio, Fasciati, Simone, Wills, James, Chidambaram, Vivek, Shteynas, Boris, Rungger, Ivan, Leek, Peter
Format: Preprint
Published: 2022
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