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Main Authors: Luo, Yongjian, Wang, Changan, Chen, Chao, Gao, Yuan, Sun, Fei, Li, Caiwen, Yin, Xiaozhe, Luo, Chunlai, Kentsch, Ulrich, Cai, Xiangbin, Bai, Mei, Fan, Zhen, Qin, Minghui, Zeng, Min, Dai, Jiyan, Zhou, Guofu, Lu, Xubing, Lou, Xiaojie, Zhou, Shengqiang, Gao, Xingsen, Chen, Deyang, Liu, Jun-Ming
Format: Preprint
Published: 2022
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Online Access:https://arxiv.org/abs/2211.15896
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author Luo, Yongjian
Wang, Changan
Chen, Chao
Gao, Yuan
Sun, Fei
Li, Caiwen
Yin, Xiaozhe
Luo, Chunlai
Kentsch, Ulrich
Cai, Xiangbin
Bai, Mei
Fan, Zhen
Qin, Minghui
Zeng, Min
Dai, Jiyan
Zhou, Guofu
Lu, Xubing
Lou, Xiaojie
Zhou, Shengqiang
Gao, Xingsen
Chen, Deyang
Liu, Jun-Ming
author_facet Luo, Yongjian
Wang, Changan
Chen, Chao
Gao, Yuan
Sun, Fei
Li, Caiwen
Yin, Xiaozhe
Luo, Chunlai
Kentsch, Ulrich
Cai, Xiangbin
Bai, Mei
Fan, Zhen
Qin, Minghui
Zeng, Min
Dai, Jiyan
Zhou, Guofu
Lu, Xubing
Lou, Xiaojie
Zhou, Shengqiang
Gao, Xingsen
Chen, Deyang
Liu, Jun-Ming
contents Dielectric capacitors are widely used in pulsed power electronic devices due to their ultrahigh power densities and extremely fast charge/discharge speed. To achieve enhanced energy storage density, both maximum polarization (Pmax) and breakdown strength (Eb) need to be improved simultaneously. However, these two key parameters are inversely correlated. In this study, order-disorder transition induced polar nanoregions (PNRs) have been achieved in PbZrO3 thin films by making use of the low-energy ion implantation, enabling us overcome the trade-off between high polarizability and breakdown strength, which leads to the tripling of the energy storage density from 20.5 J/cm3 to 62.3 J/cm3 as well as the great enhancement of breakdown strength. This approach could be extended to other dielectric oxides to improve the energy storage performance, providing a new pathway for tailoring the oxide functionalities.
format Preprint
id arxiv_https___arxiv_org_abs_2211_15896
institution arXiv
publishDate 2022
record_format arxiv
spellingShingle Tripling energy storage density through order-disorder transition induced polar nanoregions in PbZrO3 thin films by ion implantation
Luo, Yongjian
Wang, Changan
Chen, Chao
Gao, Yuan
Sun, Fei
Li, Caiwen
Yin, Xiaozhe
Luo, Chunlai
Kentsch, Ulrich
Cai, Xiangbin
Bai, Mei
Fan, Zhen
Qin, Minghui
Zeng, Min
Dai, Jiyan
Zhou, Guofu
Lu, Xubing
Lou, Xiaojie
Zhou, Shengqiang
Gao, Xingsen
Chen, Deyang
Liu, Jun-Ming
Materials Science
Dielectric capacitors are widely used in pulsed power electronic devices due to their ultrahigh power densities and extremely fast charge/discharge speed. To achieve enhanced energy storage density, both maximum polarization (Pmax) and breakdown strength (Eb) need to be improved simultaneously. However, these two key parameters are inversely correlated. In this study, order-disorder transition induced polar nanoregions (PNRs) have been achieved in PbZrO3 thin films by making use of the low-energy ion implantation, enabling us overcome the trade-off between high polarizability and breakdown strength, which leads to the tripling of the energy storage density from 20.5 J/cm3 to 62.3 J/cm3 as well as the great enhancement of breakdown strength. This approach could be extended to other dielectric oxides to improve the energy storage performance, providing a new pathway for tailoring the oxide functionalities.
title Tripling energy storage density through order-disorder transition induced polar nanoregions in PbZrO3 thin films by ion implantation
topic Materials Science
url https://arxiv.org/abs/2211.15896